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Subject
X-ray diffraction analysis [2]
X-ray diffraction analysis, Bragg-Bertrand survey geometry, Rietveld method, crystal structure, Ba3TeO6 composition [1]
X-ray structural analysis, Bragg-Bertrand survey geometry, Rietveld method, crystal structure, K3TiOF5composition. [1]
X-ray structural analysis; dielectric properties; Bragg-Brentano geometry; Rietveld method; resonator [1]
xerophyte [1]
Xila [1]
yeilding capacity [1]
Yield [2]
yield [131]
yield and productivity of winter wheat [1]
yield and economic efficiency of winter wheat cultivation [1]
yield forecasting model [1]
yield growth [1]
yield index [2]
yield mode [1]
yield modelling [1]
yield of buckwheat [1]
yield of aboveground mass [1]
yield of buckwheat [1]
yield of conditioned seeds [1]

Now showing items 4758-4777 of 16776

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